L1 L1-120 ⊙ Testnet

Scanning Acoustic Microscopy (SAM)

Industrial Inspection · High-frequency ultrasonic microscopy for buried interfaces

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Prompt — copy into your LLM

You are helping me submit a MODIFICATION of L1-120 (Scanning Acoustic Microscopy (SAM)) to the PWM Protocol — a Principle (L1) artifact.

I will paste a Markdown template (or the current L1-120.md).
1. Rewrite the Markdown so the science is correct and clearly explained for my change.
2. Regenerate the sibling L1-120.json so EVERY field matches the Markdown.
3. Keep the schema in the "File Mapping" footer at the bottom of the MD.
4. Keep the parent reference unchanged unless I ask otherwise.
Rules: the Markdown is the source of truth; use SI units; do NOT invent benchmark scores.
Output each file in its own fenced code block tagged with the filename.

Here is my template:
[PASTE THE .md HERE]

⚙ Forward Model

y = ∫_t dt `L.pulse_echo` S_raster `L.acoustic_lens` x + n,    n ~ 𝒩(0, σ²)
world state x (3D acoustic impedance)
L · acoustic lens `L.acoustic_lens`
Raster scan S_raster
L · pulse echo `L.pulse_echo`
Temporal integration ∫_t dt
observation y (acoustic detector)

Noise: additive Gaussian noise

Markdown — human-readable source of truth

⚙ auto-generated
⬇ L1-120.md